Name | Description |
---|---|
2_Glove_Box | Inert Technologies 2 Glove Box (PS3106) |
4_Glove_Box_Spin_Coater | G3P-8 Spin Coater (PS3106) |
4_Glove_Box_Thermal_Evaporator | COVAP II Angstrom Engineering (PS3106) |
BOVIA_Discovery_Materials_Studio_Software | BOVIA Discovery Materials Studio Software |
CarbonEvaporator | Carbon Evaporator (PS2117) |
Default | |
Electrospinner | Nanofiber Electrospinner Unit room 5.28, Advanced Materials Laboratory, level 5, Tonsley Building |
EmiTech_K75X_Sputter_Coater | EmiTech K75X Sputter Coater (PS2117) |
FastScan_AFM | Dimension ICON/FastScan AFM (Sir Eric Neal Building 352) |
FTIR_Bruker_Vertex_80V | Bruker Vertex 80V (PS2113) |
FTIR_Bruker_Vertex_80V_MIES_insitu | FTIR Bruker Vertex 80V MIES insitu |
Inspect_FEI_F50_SEM | Inspect FEI F50 SEM (PS2117) |
MicroCT | Nikon XT H 255ST Micro-CT (Tonsley G31) |
MIES | Electron Spectroscopy and Ion Scattering Spectroscope (PS2113) |
Multimode_Nanoscope_V | Multimode Nanoscope V 1 (Sir Eric Neal Building 352) |
Multimode_Nanoscope_V_2 | Multimode Nanoscope V 2 (Sir Eric Neal Building 352) |
Nanostructures_Clean_Room_ISO_5 | Nanostructures Clean Room (Tonsley 5.26) |
NICISS | Neutral Impact Collision Ion Scattering Sectroscopy (PS2107) |
NMR400 | NMR400 (PS244) |
NMR600 | NMR600 (PS240) |
PEEM | NanoESCA III Photoemission Electron Microscope (SENB Rm353) |
PHI710ScanningAugerNanoprobe | Auger Electron Spectromicroscopy and Secondary Electron Microscopy (PS2109A) |
Quorumtech_Dual_Target_Sputter_Coater | Quorumtech Q300T-D Dual Target Sputter Coater |
Sinterface | Surface tension and contact angle measurement (PS2117) |
Solar_Simulator | Newport Solar Simulator (PS2106) |
TERS | Horiba Raman / Nanonics TERS system (Sir Eric Neal Building 352) |
Thermal_CVD | Tube Furnace / MFC System (PS2100A) |
VFD_Laser | |
Witec | Witec Raman Microscope (Sir Eric Neal Building 352) |
X_Ray_Diffractometer | Bruker XRD (SENB349) |
XPS | Electron Spectroscopy (PS2109A) |